a doc. no : qw0905-l rev. : date : - 2007 07 - jun. a73b-1/3dbk-pf data sheet la73b-1/3dbk-pf led array pb lead-free parts ligitek electronics co.,ltd. property of ligitek only
4.3 3.3 1.5 max 0.5 typ 1.0min 25.0min 2.54typ 3.1 2.9 + - 4.0 0.5 0.5 typ 4.65 0.5 9.65 0.5 ldbk2640 note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. + - 2.54 0.25 7.15 0.5 package dimensions la73b-1/3dbk-pf part no. 2.4 0.5 11.6 4.4 15.3 dbk 5.08 dbk 2.5 1.5 dbk 2.9x3 ligitek electronics co.,ltd. property of ligitek only page1/5
parameter power dissipation peak forward current duty 1/10@10khz reverse current @5v electrostatic discharge( * ) storage temperature ingan/gan material operating temperature note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. absolute maximum ratings at ta=25 typical electrical & optical characteristics (ta=25 ) la73b-1/3dbk-pf part no forward current v 150 esd luminous intensity @20ma(mcd) forward voltage @20ma(v) blue diffused blue color emittedlens 470303.54.0 spectral halfwidth nm wave length nm d dominant typ. max. 38 450 220 viewing angle 2 1/2 (deg) typ. min. t opr tstg -30 ~ +100 -20 ~ +80 ir pd i fp i f 120 50 100 30 symbol dbk ratings a mw ma ma unit page2/5 ligitek electronics co.,ltd. property of ligitek only * static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. part no. la73b-1/3dbk-pf
fig.5 relative intensity vs. wavelength typical electro-optical characteristics curve ligitek electronics co.,ltd. property of ligitek only 1.03.04.0 0 1 1.0 r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) 450 0.0 400500550 0.5 0.5 r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 20 ambient temperature( ) ambient temperature( ) 0 -20 -40 0.8 0 -40-20 100 80 60 40 20 0.0 60100 80 40 fig.4 relative intensity vs. temperature 2.5 1.0 0.9 1.1 1.5 1.0 2.0 fig.3 forward voltage vs. temperature 1.2 3.0 r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a f o r w a r d c u r r e n t ( m a ) forward current(ma) forward voltage(v) 2.05.0110 0.0 0.5 1.0 1.5 2.0 1001000 fig.2 relative intensity vs. forward current fig.1 forward current vs. forward voltage 2.5 3.0 1 10 100 1000 dbk chip page3/5 part no. la73b-1/3dbk-pf
note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. 60 seconds max 0 preheat 0 25 2 /sec max 100 50 150 time(sec) temp( c) 120 260 5 /sec max 260 c3sec max dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to case) 2.wave soldering profile soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to case) ligitek electronics co.,ltd. property of ligitek only page 4/5 la73b-1/3dbk-pf part no.
the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this test is the resistance of the device under tropical for hours. this test intended to see soldering well performed or not. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.t.sol=230 5 2.dwell time=5 1sec 1.t.sol=260 5 2.dwell time= 10 1sec. solderability test solder resistance test high temperature high humidity test thermal shock test 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) low temperature storage test mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202:103b jis c 7021: b-11 jis c 7021: b-12 description the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. ligitek electronics co.,ltd. property of ligitek only high temperature storage test operating life test 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) test condition 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) test item reliability test: mil-std-883:1008 jis c 7021: b-10 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 reference standard page 5/5 part no. la73b-1/3dbk-pf
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